Self-checking test circuits for latches and flip-flops.

Renato P. Ribas Yuyang Sun André Inácio Reis André Ivanov

Published in: IOLTS (2011)

Keyphrases

flip flops
power dissipation
multiple input
high speed
power consumption
neural network
case study
object oriented
low cost
test cases
input output
low power
built in self test