Low-Power Test Data Application in EDT Environment Through Decompressor Freeze.
Dariusz CzyszGrzegorz MrugalskiJanusz RajskiJerzy TyszerPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2008)
Keyphrases
- test data
- low power
- power consumption
- low cost
- high speed
- test cases
- test set
- data sets
- real time
- training data
- training set
- single chip
- vlsi circuits
- input image
- training and test data
- logic circuits
- vlsi architecture
- supervised learning
- cross validation
- databases
- image sensor
- low power consumption
- mixed signal
- search based testing