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Variation and Reliability in FPGAs.

Edward A. StottZhenyu GuanJoshua M. LevineJustin S. J. WongPeter Y. K. Cheung
Published in: IEEE Des. Test (2013)
Keyphrases
  • field programmable gate array
  • data sets
  • case study
  • low cost
  • real time
  • learning algorithm
  • computer vision
  • information systems
  • failure rate