Using Clock-Vdd to Test and Diagnose the Power-Switch in Power-Gating Circuit.

Hsiang-Hui Huang Ching-Hwa Cheng

Published in: VTS (2007)

Keyphrases

power consumption
high speed
duty cycle
power reduction
image processing
data sets
low power
database
image sequences
multiscale
multi agent
search algorithm
test cases
fault diagnosis
real time
statistical tests
single phase