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films containing Si nanocrystals directly suitable for transmission electron microscopy.

S. NovikovJ. SinkkonenTimur NikitinL. KhriachtchevM. RäsänenE. Haimi
Published in: Microelectron. J. (2008)
Keyphrases
  • transmission electron microscopy
  • x ray
  • metal oxide
  • high resolution
  • chemical vapor deposition
  • database
  • neural network
  • electron microscopy
  • thin film transistor
  • face recognition