Login / Signup

Information theoretic approach to address delay and reliability in long on-chip interconnects.

Rohit SinghalGwan S. ChoiRabi N. Mahapatra
Published in: ICCAD (2006)
Keyphrases
  • power dissipation
  • low cost
  • power consumption
  • low power
  • high speed
  • reliability analysis
  • database
  • high density
  • input output
  • failure rate
  • vlsi implementation