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Lifetime estimation of SiC MOSFETs under high temperature reverse bias test.
Kosuke Uchida
Toru Hiyoshi
Taro Nishiguchi
Hirofumi Yamamoto
Masaki Furumai
Takashi Tsuno
Yasuki Mikamura
Published in:
Microelectron. Reliab. (2016)
Keyphrases
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high temperature
parameter estimation
energy consumption
density estimation
diesel engine
case study
wireless sensor networks
software development
test data
statistical tests
accurate estimation
estimation accuracy
data gathering
life span