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Partial Coaxial Through-Silicon via for Suppressing the Substrate Noise in 3-Dimensional Integrated Circuit.
Jinrong Su
Wenmei Zhang
Chunhui Yao
Published in:
IEEE Access (2019)
Keyphrases
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integrated circuit
semiconductor devices
electron beam
metal oxide semiconductor
noise level
image noise
multi dimensional
image details
noise reduction
printed circuit boards
missing data
noisy data
low cost
impulse noise
noise free
high speed
hardware description language
noise removal
high density
edge detection