IMAGE DETAILS
Experts
- Etienne E. Kerre
- Bogdan Smolka
- Mike Nachtegael
- Hong Ren Wu
- Ayyaz Hussain
- Masaaki Ikehara
- Stefan Schulte
- Igor Djurovic
- Tae-Sun Choi
- Ting-Zhu Huang
- Erkan Besdok
- Erik Axell
- Antti Valmari
- Vicente Vidal
- Volodymyr I. Ponomaryov
- Xu Huang
- Deyu Meng
- Allan C. Madoc
- Agnès Desolneux
- Sanjit K. Mitra
- Vladimir V. Lukin
- Samuel Morillas
- Takuro Yamaguchi
- Wen-Hsiang Tsai
- María Guadalupe Sánchez
- Valentín Gregori
- Dietrich Van der Weken
- Valérie De Witte
- Xuming Zhang
- Tom Mélange
- Thomas Neele
- Chao Li
- Abdullah Toprak
- Sos S. Agaian
- Lianghai Jin
- Igor N. Aizenberg
- Pinar Çivicioglu
- Vimal Bhatia
- A. J. Han Vinck
Venues
- CoRR
- IEEE Trans. Image Process.
- ICASSP
- Signal Process.
- IEEE Signal Process. Lett.
- J. Electronic Imaging
- Signal Image Video Process.
- Multim. Tools Appl.
- J. Comput. Phys.
- IEEE Access
- ICIP
- IET Image Process.
- IEEE Trans. Commun.
- Pattern Recognit.
- IEEE Geosci. Remote. Sens. Lett.
- ICME
- CVPR
- ACM Trans. Graph.
- Sensors
- Signal Process. Image Commun.
- IACR Cryptol. ePrint Arch.
- Image Vis. Comput.
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- IEEE Trans. Instrum. Meas.
- ISCAS
- ICIP (1)
- IEEE Trans. Signal Process.
- Digit. Signal Process.
- EURASIP J. Adv. Signal Process.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Theor. Comput. Sci.
- Neural Comput. Appl.
- IET Signal Process.
- IEEE Trans. Geosci. Remote. Sens.
- J. Math. Imaging Vis.
- Comput. Aided Geom. Des.
- J. Vis. Commun. Image Represent.
- SIAM J. Imaging Sci.
- Pattern Recognit. Lett.
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