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Test Time Reduction in EDT Bandwidth Management for SoC Designs.

Jakub JanickiMark KassabGrzegorz MrugalskiNilanjan MukherjeeJanusz RajskiJerzy Tyszer
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2013)
Keyphrases
  • management system
  • information systems
  • test data
  • information management
  • neural network
  • data processing
  • data sets
  • image processing
  • knowledge management
  • project management
  • video streaming