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Managing Test Coverage Uncertainty due to Random Noise in Nano-CMOS: A Case-Study on an SRAM Array.
Vikram B. Suresh
Sandip Kundu
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2016)
Keyphrases
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random noise
random access memory
power consumption
test suite
low signal to noise ratio
low power
case study
design considerations
focal plane
low voltage
test cases
low cost
set of test cases
conditional probabilities
image sensor
neural network
uncertain data
infrared
high speed