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Ultra-Low Power Stress Sensing By Leakage Current of P-N Junctions.

Zhiqiang FengXuefeng HeJunru LiShen LiZhengguo Shang
Published in: IEEE SENSORS (2020)
Keyphrases
  • ultra low power
  • leakage current
  • low power
  • sensor networks
  • silicon dioxide
  • junction detection
  • image sensor
  • power line
  • real time
  • line segments
  • low voltage
  • hidden markov models
  • low cost
  • electrical properties