JUNCTION DETECTION
Experts
- Gui-Song Xia
- M. Idrissi-Benzohra
- The Anh Pham
- Boaz Nadler
- Mathieu Delalandre
- M. Abdelaoui
- Jean-Yves Ramel
- Norbert Krüger
- Sabine Barrat
- Meirav Galun
- M. Benzohra
- Ronen Basri
- Elias Kougianos
- Songlin Hu
- Amélie Héliou
- Nagendra Gajjar
- Pablo Musé
- Dominik Budday
- Mariano Tepper
- Athanasios Dimoulas
- B. S. Shivaram
- Narendra Ahuja
- Ramesh C. Jain
- Bryan Gardiner
- Michio Naito
- Henry van den Bedem
- Haruko Okamura
- Gerald Sommer
- Marta Mejail
- Maarten Löffler
- Sonya A. Coleman
- Zhaojuan Yue
- Marc J. van Kreveld
- Jean Coignus
- Quang T. Duong
- Nati Ofir
- Wenlong Cai
- Stefan Slesazeck
- Irina Kostitsyna
Venues
- CoRR
- Pattern Recognit.
- Sensors
- IEICE Trans. Electron.
- IEEE Access
- ICPR
- Pattern Recognit. Lett.
- Discret. Math.
- Sci. China Inf. Sci.
- IEEE Trans. Image Process.
- CVPR
- Microelectron. J.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IGARSS
- DAGM-Symposium
- ICIP (1)
- Image Vis. Comput.
- IRPS
- Remote. Sens.
- IEEE Trans. Computers
- IEEE Signal Process. Lett.
- AAAI
- Electron. J. Comb.
- SIAM J. Appl. Math.
- J. Vis. Commun. Image Represent.
- Microelectron. Reliab.
- Future Gener. Comput. Syst.
- MIPRO
- ICONIP (1)
- ISBI
- SMC
- ICMLA
- PSIVT
- ICARCV
- CAIP
- IEEE Trans. Instrum. Meas.
- J. Comput. Neurosci.
- BMVC
- IJCNN
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