JUNCTION DETECTION
Experts
- Gui-Song Xia
- Sabine Barrat
- Meirav Galun
- M. Benzohra
- Jean-Yves Ramel
- Norbert Krüger
- Ronen Basri
- The Anh Pham
- M. Idrissi-Benzohra
- M. Abdelaoui
- Boaz Nadler
- Mathieu Delalandre
- Laveen N. Kanal
- Mark Thurston
- Ingo van Duijn
- Erika Covi
- Susan M. Haynes
- Liangpei Zhang
- Kaihua Cao
- Ullrich Köthe
- Dou Hu
- Bryan W. Scotney
- Wei Zhou
- Azriel Rosenfeld
- Laurent Grenouillet
- Hae Yong Kim
- Di Zang
- Viktor Havel
- Suzanne Lancaster
- G. R. Dattatreya
- Nan Xue
- Elisabetta Chicca
- Saraju P. Mohanty
- Philipp Klein
- Justine Barbot
- Lingwei Wei
- Andrés Almansa
- Weiming Shen
- Tuan D. Pham
Venues
- CoRR
- Pattern Recognit.
- Sensors
- IEICE Trans. Electron.
- IEEE Access
- ICPR
- Pattern Recognit. Lett.
- Discret. Math.
- IEEE Trans. Image Process.
- Sci. China Inf. Sci.
- Microelectron. J.
- CVPR
- ICIP (1)
- Image Vis. Comput.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IGARSS
- DAGM-Symposium
- Int. J. Comput. Vis.
- IEEE Trans. Computers
- IEEE Signal Process. Lett.
- AAAI
- Electron. J. Comb.
- IRPS
- Remote. Sens.
- ISBI
- ICONIP (1)
- SMC
- ICMLA
- J. Vis. Commun. Image Represent.
- SIAM J. Appl. Math.
- Future Gener. Comput. Syst.
- MIPRO
- Microelectron. Reliab.
- IEEE Trans. Instrum. Meas.
- J. Comput. Neurosci.
- BMVC
- IJCNN
- Comput. Vis. Image Underst.
- Ars Comb.
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