JUNCTION DETECTION
Experts
- Gui-Song Xia
- M. Abdelaoui
- M. Benzohra
- Norbert Krüger
- Jean-Yves Ramel
- Meirav Galun
- Mathieu Delalandre
- Sabine Barrat
- M. Idrissi-Benzohra
- Ronen Basri
- The Anh Pham
- Boaz Nadler
- Thomas Mikolajick
- Stefan Slesazeck
- Sinan Kalkan
- Sonya A. Coleman
- Nan Xue
- Susan M. Haynes
- Quang T. Duong
- Mariano Tepper
- Laveen N. Kanal
- Elias Kougianos
- Bryan Gardiner
- Ramesh C. Jain
- Kaihua Cao
- Irina Kostitsyna
- Ullrich Köthe
- Elisabetta Chicca
- Ole Richter
- Zhaojuan Yue
- Michio Naito
- Athanasios Dimoulas
- Haruko Okamura
- Marc J. van Kreveld
- Songlin Hu
- Bryan W. Scotney
- Narendra Ahuja
- Rasmus Fonseca
- Weiming Shen
Venues
- CoRR
- Pattern Recognit.
- Sensors
- IEICE Trans. Electron.
- ICPR
- Pattern Recognit. Lett.
- IEEE Access
- Sci. China Inf. Sci.
- CVPR
- IEEE Trans. Image Process.
- Microelectron. J.
- Image Vis. Comput.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICIP (1)
- Discret. Math.
- DAGM-Symposium
- IGARSS
- Int. J. Comput. Vis.
- Appl. Soft Comput.
- BMVC
- ICARCV
- Comput. Vis. Image Underst.
- IJCNN
- SIAM J. Imaging Sci.
- ICRA
- IEEE Trans. Educ.
- IEEE Trans. Computers
- Future Gener. Comput. Syst.
- CAIP
- IRPS
- ICME
- ICONIP (1)
- PLoS Comput. Biol.
- Microelectron. Reliab.
- Ars Comb.
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Consumer Electron.
- J. Vis. Commun. Image Represent.
- IBM J. Res. Dev.
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