Login / Signup

Layout-aware scan chain reorder for launch-off-shift transition test coverage.

Sying-Jyan WangKuo-Lin PengKuang-Cyun HsiaoKatherine Shu-Min Li
Published in: ACM Trans. Design Autom. Electr. Syst. (2008)
Keyphrases
  • test suite
  • set of test cases
  • test cases
  • machine learning
  • artificial intelligence
  • life cycle
  • information retrieval
  • web services
  • database systems
  • scan data
  • transition model