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Layout-aware scan chain reorder for launch-off-shift transition test coverage.
Sying-Jyan Wang
Kuo-Lin Peng
Kuang-Cyun Hsiao
Katherine Shu-Min Li
Published in:
ACM Trans. Design Autom. Electr. Syst. (2008)
Keyphrases
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test suite
set of test cases
test cases
machine learning
artificial intelligence
life cycle
information retrieval
web services
database systems
scan data
transition model