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Retiming for BIST-Sequential Circuits.

Samir LejmiBozena KaminskaBechir Ayari
Published in: ISCAS (1995)
Keyphrases
  • built in self test
  • sequential search
  • digital circuits
  • databases
  • analog circuits
  • database
  • real time
  • case study
  • power consumption
  • integrated circuit
  • power reduction
  • analog vlsi
  • tunnel diode