Simultaneous Bidirectional Test Data Flow for a Low-cost Wafer Test Strategy.

Burnell G. West

Published in: ITC (2003)

Keyphrases

similarity measure
test data
low cost
test cases
training data
test set
data sets
training set
training and test data
testing process
search based testing
real time
training samples
integrated circuit
prior knowledge
relational databases
semiconductor manufacturing
reinforcement learning