Burnell G. West

Publication Activity (10 Years)

Years Active: 1983-2004
Publications (10 Years): 0

Publications

Burnell G. West, Michael F. Jones
Digital Synchronization for Reconfigurable ATE. ITC (2004)
Burnell G. West
Open Architecture ATE: Prospects and Problems. ITC (2004)
Burnell G. West
Multi-GB/s IC Test Challenges and Solutions. ITC (2003)
Burnell G. West
Simultaneous Bidirectional Test Data Flow for a Low-cost Wafer Test Strategy. ITC (2003)
Burnell G. West
Open ATE Architecture: Key Challenges. ITC (2002)
Mark Malinoski, Burnell G. West
Rapid-response temperature control provides new defect screening opportunities. ITC (2001)
Luca Sartori, Burnell G. West
The path to one-picosecond accuracy. ITC (2000)
Burnell G. West
At-speed structural test. ITC (1999)
Burnell G. West
Accuracy requirements in at-speed functional test. ITC (1999)
Burnell G. West
Functional ATE can meet the challenges. ITC (1998)
Didier Wimmers, Kris Sakaitani, Burnell G. West
500-MHz Testing on a 100-MHz Tester. ITC (1994)
Burnell G. West
Attainable Accuracy of Autocalibrating VLSI Test Systems. ITC (1983)