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SoC Yield Improvement: Redundant Architectures to the Rescue?

Julien VialAlberto BosioPatrick GirardChristian LandraultSerge PravossoudovitchArnaud Virazel
Published in: ITC (2008)
Keyphrases
  • machine learning
  • significant improvement
  • neural network
  • highly redundant
  • learning algorithm
  • multi agent
  • learning environment
  • expert systems
  • low power