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Design considerations of a novel Triple Oxide Trench Deep Gate LDMOS to improve self-heating effect and breakdown voltage.

Amir GavoshaniAli A. Orouji
Published in: IET Circuits Devices Syst. (2022)
Keyphrases
  • leakage current
  • low voltage
  • design considerations
  • power line
  • random access memory
  • electrical properties
  • reinforcement learning
  • control system
  • pedagogical agents
  • silicon dioxide
  • gate insulator