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Bit-line leakage current tracking and self-compensation circuit for SRAM reliability design.
Chenghu Dai
Yuanyuan Du
Qi Shi
Ruixuan Wang
Hao Zheng
Wenjuan Lu
Chunyu Peng
Licai Hao
Zhiting Lin
Xiulong Wu
Published in:
Microelectron. J. (2023)
Keyphrases
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circuit design
real time
power consumption
digital circuits
random access memory
leakage current
design process
design considerations
cmos technology
low voltage
electronic circuits