Login / Signup

AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects.

Tsung-Yeh LiShi-Yu HuangHsuan-Jung HsuChao-Wen TzengChih-Tsun HuangJing-Jia LiouHsi-Pin MaPo-Chiun HuangJenn-Chyou BorCheng-Wen WuChing-Cheng TienMike Wang
Published in: DFT (2010)
Keyphrases
  • small number
  • neural network
  • feature extraction
  • test cases
  • statistical significance
  • real world
  • machine learning
  • case study
  • image segmentation
  • three dimensional
  • mobile robot