On-chip delay measurement for silicon debug.

Ramyanshu Datta Antony Sebastine Ashwin Raghunathan Jacob A. Abraham

Published in: ACM Great Lakes Symposium on VLSI (2004)

Keyphrases

high density
high speed
low cost
cmos technology
power dissipation
data acquisition
power consumption
low power
analog vlsi
programmable logic
data center
physical design
low voltage
semiconductor devices
functional verification