Quality Capability Assessment for Thin-Film Chip Resistor.

Kuen-Suan Chen Chun-Ming Yang

Published in: IEEE Access (2019)

Keyphrases

thin film
high density
high quality
quality assessment
high speed
low cost
higher quality
low density
grain size
plasma etching
data mining
short circuit
film thickness
solar cell
single view
multi layer
single image
genetic algorithm