A built-in self-testing method for embedded multiport memory arrays.
Vinod NarayananSwaroop GhoshWen-Ben JoneSunil R. DasPublished in: IEEE Trans. Instrum. Meas. (2005)
Keyphrases
- high accuracy
- experimental evaluation
- dynamic programming
- detection method
- objective function
- significant improvement
- preprocessing
- edge detection
- cost function
- face recognition
- segmentation method
- clustering method
- main contribution
- fully automatic
- synthetic data
- test data
- data sets
- computationally efficient
- prior knowledge
- evolutionary algorithm
- data structure
- similarity measure
- image sequences
- image processing
- genetic algorithm