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An automated ultrasonic inspection approach for flip chip solder joint assessment.

Ryan S. H. YangDerek R. BradenGuang-Ming ZhangDavid M. Harvey
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • printed circuit boards
  • visual inspection
  • semi automated
  • low cost
  • computer assisted
  • vlsi implementation
  • high temperature
  • data sets
  • high speed
  • infrared
  • quality control
  • automated analysis
  • physical design
  • vlsi design