Object Wavefunction Reconstruciton in High Resolution Electron Microscopy.
Dirk Van DyckMarc Op de BeeckPublished in: ICIP (3) (1994)
Keyphrases
- electron microscopy
- high resolution
- x ray
- low energy
- low resolution
- image stacks
- laser scanner
- transmission electron microscopy
- thin film
- high quality
- super resolution
- remote sensing
- object model
- high frequency
- multiple objects
- field of view
- object tracking
- neural network
- data management
- moving objects
- complex objects
- high resolution images
- d objects
- artificial neural networks
- image processing