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Automatic Identification of Functionally Untestable Cell-Aware Faults in Microprocessors.
Nikolaos Ioannis Deligiannis
Tobias Faller
Iacopo Guglielminetti
Riccardo Cantoro
Bernd Becker
Matteo Sonza Reorda
Published in:
ATS (2023)
Keyphrases
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automatic identification
fault diagnosis
fault detection
single chip
computing power
multiple faults
model based diagnosis
computer architecture
microscopy images
image processing
high quality
pattern recognition
multiresolution
multi view
test cases