Zero aliasing ROM BIST.

O. Kebichi Vyacheslav N. Yarmolik Michael Nicolaidis

Published in: J. Electron. Test. (1994)

Keyphrases

high frequency
low pass filtering
high resolution
sampling theorem
light field
low pass
reconstruction error
spatial resolution
super resolution
frequency domain
color filter array
high frequency components
built in self test
data mining
low frequency
image restoration
low cost