SAMPLING THEOREM
Experts
- Yves Wiaux
- Martin Vetterli
- Jason D. McEwen
- James Noble
- Michael Unser
- Gamlet S. Khanyan
- Wenchang Sun
- Yonina C. Eldar
- Ye Yuan
- Thierry Blu
- Xingwei Zhou
- Jun Shi
- Zhexuan Zeng
- Gilles Puy
- Brett Bernstein
- Carlos Fernandez-Granda
- Sophia Drossopoulou
- Matthew A. Prelee
- Jean-Philippe Thiran
- Pierre Vandergheynst
- Tien-Tsin Wong
- Peter T. Breuer
- Naitong Zhang
- Zuogong Yue
- David L. Neuhoff
- Michael Lindenbaum
- Dimitri Van De Ville
- Rashad M. Asharabi
- Yehoshua Y. Zeevi
- Yoram Bresler
- Lenan Wu
- Ben Adcock
- Ahmed I. Zayed
- Zhanjie Song
- Ayush Bhandari
- Anders C. Hansen
- Lawrence J. Fogel
- Juri Ranieri
- Martin Büttner
Venues
- CoRR
- IEEE Trans. Signal Process.
- ICASSP
- IEEE Trans. Inf. Theory
- ICIP
- Signal Process.
- EWDTS
- Inf. Control.
- IEEE Trans. Image Process.
- IGARSS
- IEEE Trans. Medical Imaging
- ISCAS
- ECOOP Workshops
- EUSIPCO
- ICASSP (3)
- IEEE Trans. Vis. Comput. Graph.
- IEEE Signal Process. Lett.
- GlobalSIP
- IEEE Trans. Acoust. Speech Signal Process.
- Commun. Stat. Simul. Comput.
- Appl. Math. Comput.
- Numer. Algorithms
- Remote. Sens.
- ICPR
- IEEE Trans. Instrum. Meas.
- ICIAR
- Multidimens. Syst. Signal Process.
- IEICE Trans. Inf. Syst.
- J. Electron. Test.
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Commun. Mag.
- IRE Trans. Inf. Theory
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Autom. Control.
- ACM Trans. Graph.
- Pattern Recognit. Lett.
- Signal Image Video Process.
- Symmetry
- SMC
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