SAMPLING THEOREM
Experts
- Yves Wiaux
- Martin Vetterli
- Jason D. McEwen
- James Noble
- Michael Unser
- Gamlet S. Khanyan
- Ye Yuan
- Yonina C. Eldar
- Thierry Blu
- Xingwei Zhou
- Wenchang Sun
- David L. Neuhoff
- Carlos Fernandez-Granda
- Pierre Vandergheynst
- Zuogong Yue
- Tien-Tsin Wong
- Dimitri Van De Ville
- Peter T. Breuer
- Michael Lindenbaum
- Gilles Puy
- Matthew A. Prelee
- Zhexuan Zeng
- Jean-Philippe Thiran
- Sophia Drossopoulou
- Brett Bernstein
- Jun Shi
- Naitong Zhang
- Alain Horé
- François Deschênes
- Xiaochuan Pan
- Toshiyasu Matsushima
- Guanghui Lan
- Ben Adcock
- Yuval Eldar
- Yoram Bresler
- Anders C. Hansen
- Martin Büttner
- Jaakko Astola
- David Francis Walnut
Venues
- CoRR
- IEEE Trans. Signal Process.
- ICASSP
- IEEE Trans. Inf. Theory
- ICIP
- Signal Process.
- EWDTS
- Inf. Control.
- IGARSS
- ECOOP Workshops
- IEEE Trans. Image Process.
- ISCAS
- IEEE Trans. Medical Imaging
- IEEE Trans. Vis. Comput. Graph.
- GlobalSIP
- Appl. Math. Comput.
- EUSIPCO
- IEEE Signal Process. Lett.
- IEEE Trans. Instrum. Meas.
- ICASSP (3)
- Commun. Stat. Simul. Comput.
- ICPR
- Numer. Algorithms
- IEEE Trans. Acoust. Speech Signal Process.
- Remote. Sens.
- IEEE Trans. Circuits Syst. II Express Briefs
- FUSION
- Multidimens. Syst. Signal Process.
- IEEE Trans. Pattern Anal. Mach. Intell.
- SIAM J. Imaging Sci.
- Pattern Recognit. Lett.
- ACM Trans. Graph.
- Digit. Signal Process.
- ACSSC
- SMC
- IEEE Trans. Autom. Control.
- IEEE Trans. Geosci. Remote. Sens.
- Medical Image Anal.
- IRE Trans. Inf. Theory
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