Predicting fault detectability in combinational circuits - a new design tool?
John L. FikePublished in: DAC (1975)
Keyphrases
- design tools
- logic circuits
- computer aided
- asynchronous circuits
- fault diagnosis
- physical design
- design space
- fault models
- fault detection
- circuit design
- high speed
- analog circuits
- delay insensitive
- instructional design
- low power
- image quality
- fault model
- fault management
- image analysis
- artificial intelligence
- analog vlsi
- neural network