Login / Signup
A 0.18 µm CMOS Implementation of On-chip Analogue Test Signal Generation from Digital Test Patterns.
Luís Rolíndez
Salvador Mir
Guillaume Prenat
Ahcène Bounceur
Published in:
DATE (2004)
Keyphrases
</>
circuit design
low cost
neural network
multiresolution
software development
test cases
frequency domain
high frequency
statistical tests