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A 0.18 µm CMOS Implementation of On-chip Analogue Test Signal Generation from Digital Test Patterns.
Luís Rolíndez
Salvador Mir
Guillaume Prenat
Ahcène Bounceur
Published in:
DATE (2004)
Keyphrases
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circuit design
low cost
neural network
multiresolution
software development
test cases
frequency domain
high frequency
statistical tests