Condition monitoring on complex machinery for predictive maintenance and process control.
Juan DaiC. L. Philip ChenXiao-Yan XuPeng HuPublished in: SMC (2008)
Keyphrases
- process control
- condition monitoring
- control system
- product quality
- intelligent control
- fault diagnosis
- manufacturing process
- fault detection
- high level
- semiconductor manufacturing
- software maintenance
- real world
- artificial neural networks
- steady state
- expert systems
- control charts
- acoustic emission
- graduate education