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A Scan-Out Power Reduction Method for Multi-cycle BIST.

Senling WangYasuo SatoKohei MiyaseSeiji Kajihara
Published in: Asian Test Symposium (2012)
Keyphrases
  • reduction method
  • variable precision
  • selection algorithm
  • data sets
  • np hard
  • artificial intelligence
  • database systems
  • multiscale
  • object recognition
  • artificial neural networks