Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT.
Cezary SydloBastian MottetHusin GanisHans L. HartnagelViktor KrozerSylvain L. DelageSimone CassetteEric ChartierD. FloriotSteven BlandPublished in: Microelectron. Reliab. (2001)