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An extension of probabilistic simulation for reliability analysis of CMOS VLSI circuits.
Farid N. Najm
Ibrahim N. Hajj
Ping Yang
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1991)
Keyphrases
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vlsi circuits
reliability analysis
low power
power plant
mixed signal
low cost
intelligent systems
condition monitoring
power dissipation