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High temperature induced failure in Ti/Al/Ni/Au Ohmic contacts on AlGaN/GaN heterostructure.

Zhihua DongJinyan WangCheng P. WenShenghou LiuRumin GongMin YuYilong HaoFujun XuBo ShenYangyuan Wang
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • high temperature
  • structuring elements
  • low energy
  • website
  • electric field
  • ieee trans
  • real time
  • neural network
  • failure rate
  • failure detection
  • diesel engine
  • silicon dioxide