Broad-band characterization of magnetic and dielectric thin films using a microstrip line.
Patrick QuéffélecMarcel Le Floc'hPhilippe GelinPublished in: IEEE Trans. Instrum. Meas. (1998)
Keyphrases
- microstrip
- thin film
- dielectric constant
- patch antenna
- film thickness
- chemical vapor deposition
- dual band
- transmission line
- simulation software
- small size
- high density
- magnetic field
- electrical properties
- ground plane
- low pass filter
- high pass
- grain size
- silicon nitride
- multi layer
- refractive index
- pose estimation
- room temperature
- low pass
- contrast enhancement
- multiple cameras
- level set
- multiscale
- neural network