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A Dependable Processor by Using Built-in Self Test to Tolerate Periodical Transient Faults under Highly Electromagnetic Environment.
Aromhack Saysanasongkham
Masahiko Negishi
Masayuki Arai
Satoshi Fukumoto
Published in:
PRDC (2012)
Keyphrases
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built in self test
real time
mobile robot
high speed
integrated circuit
neural network
fault diagnosis
steady state
computing environments
fault detection
artificial intelligence
dynamic environments
virtual world
test cases
autonomous agents
complex environments