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Evolution of substrate noise generation mechanisms with CMOS technology scaling.

Mustafa BadarogluPiet WambacqGeert Van der PlasStéphane DonnayGeorges G. E. GielenHugo J. De Man
Published in: IEEE Trans. Circuits Syst. I Regul. Pap. (2006)
Keyphrases
  • cmos technology
  • low power
  • power consumption
  • low voltage
  • spl times
  • low cost
  • high speed
  • missing data
  • signal to noise ratio
  • machine vision
  • real time
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  • image analysis