Design and implementation of a parallel automatic test pattern generation algorithm with low test vector count.
Robert ButlerBrion L. KellerSarala PaliwalRichard SchoonoverJoseph SwentonPublished in: ITC (2000)
Keyphrases
- generation algorithm
- test data
- parallel distributed
- real time
- experimental design
- parallel processing
- pattern matching
- test cases
- user interface
- information systems
- neural network
- data sets
- knowledge based systems
- scheduling problem
- software architecture
- artificial intelligence
- efficient implementation
- computer architecture
- implementation issues
- high level synthesis
- database
- built in self test