Design of efficient BIST test pattern generators for delay testing.

Chih-Ang Chen Sandeep K. Gupta

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1996)

Keyphrases

built in self test
design process
software testing
computationally expensive
information systems
test data
design decisions
test data generation
test case generation
database
website
multi agent systems
knowledge based systems
test set
wireless networks
cost effective