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A Deep Learning-Based Approach for Quality Control and Defect Detection for Industrial Bagging Systems.

Mathieu JunckerIsmaïl KhrissJean BrousseauSteven PigeonAlexis DarisseBilly Lapointe
Published in: IEEE ICCI*CC (2020)
Keyphrases
  • automated visual inspection
  • quality control
  • defect detection
  • deep learning
  • machine vision
  • quality assurance
  • unsupervised learning
  • feature extraction
  • real time
  • data sets
  • learning algorithm