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A Deep Learning-Based Approach for Quality Control and Defect Detection for Industrial Bagging Systems.
Mathieu Juncker
Ismaïl Khriss
Jean Brousseau
Steven Pigeon
Alexis Darisse
Billy Lapointe
Published in:
IEEE ICCI*CC (2020)
Keyphrases
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automated visual inspection
quality control
defect detection
deep learning
machine vision
quality assurance
unsupervised learning
feature extraction
real time
data sets
learning algorithm