Login / Signup
A Reliability Statistics Perspective on the Pitfalls of Standard Wafer-Level Electromigration Accelerated Test (SWEAT).
Cher Ming Tan
Kelvin Ngan Chong Yeo
Published in:
J. Electron. Test. (2001)
Keyphrases
</>
information retrieval
highly reliable
viewpoint
higher level
test data
database
real time
social networks
learning environment
statistical tests
integrated circuit
massively parallel
image statistics
reliability analysis