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A BIST Methodology for Comprehensive Testing of RAM with Reduced Heat Dissipation.

Hugo CheungSandeep K. Gupta
Published in: ITC (1996)
Keyphrases
  • heat transfer
  • test cases
  • real time
  • neural network
  • test data
  • b tree
  • numerical solution
  • image sequences
  • test set
  • numerical simulations
  • design methodology
  • software testing
  • built in self test