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A Yield and Reliability Improvement Methodology Based on Logic Redundant Repair with a Repairable Scan Flip-Flop Designed by Push Rule.

Masanori KurimotoJun MatsushimaShigeki OhbayashiYoshiaki FukuiMichio KomodaNobuhiro Tsuda
Published in: ACM Trans. Design Autom. Electr. Syst. (2012)
Keyphrases
  • reliability analysis
  • flip flops
  • real time
  • logic programming
  • modal logic
  • design methodology
  • active databases
  • error detection