Power constrained and defect-probability driven SoC test scheduling with test set partitioning.

Zhiyuan He Zebo Peng Petru Eles

Published in: DATE (2006)

Keyphrases

test set
test data
test cases
error rate
training set
random selection
training data
class distribution
scheduling problem
probability distribution
scheduling algorithm
hardware and software
evaluation methodology
power consumption
training and test data
image processing
active learning