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Increase in Read Noise Margin of Single-Bit-Line SRAM Using Adiabatic Change of Word Line Voltage.

Shunji NakataHiroki HanazonoHiroshi MakinoHiroki MorimuraMasayuki MiyamaYoshio Matsuda
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2014)
Keyphrases
  • co occurrence
  • production line
  • power supply
  • objective function
  • signal to noise ratio
  • noise reduction