Login / Signup

Reliability of MgO in magnetic tunnel junctions formed by MgO sputtering and Mg oxidation.

Akinobu TeramotoKeiichi HashimotoTomoyuki SuwaJun-ichi TsuchimotoMarie HayashiHyeonwoo ParkShigetoshi Sugawa
Published in: IRPS (2018)
Keyphrases
  • magnetic field
  • electron beam
  • database
  • optimal solution
  • high speed
  • x ray
  • junction detection
  • learning algorithm
  • expert systems
  • solid state
  • metal oxide