Login / Signup

Impact of Faults in Combinational Logic of Commercial Microcontrollers.

Daniel GilJoaquin GraciaJuan Carlos BarazaPedro J. Gil
Published in: EDCC (2005)
Keyphrases
  • fault diagnosis
  • databases
  • hardware and software
  • fault detection
  • high impact
  • economic impact
  • real world
  • genetic algorithm
  • three dimensional
  • multiscale