Voltage, Throughput, Power, Reliability, and Multicore Scaling.

Fei Xia Ashur Rafiev Ali Aalsaud Mohammed A. Noaman Al-Hayanni James J. Davis Joshua M. Levine Andrey Mokhov Alexander B. Romanovsky Rishad A. Shafik Alex Yakovlev Sheng Yang

Published in: Computer (2017)

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